Wang H., Zhang Y., Haugan T., Zhang D., Huang J., Wu J., Sebastian M.A., Jian J., Gautam B., Ogunjimi V., Panth M.
Ключевые слова: HTS, YBCO, nanocomposites, doping effect, films, fabrication, PLD process, substrate SrTiO3, interfaces, lattice parameter, mechanical properties, strain effects, microstructure, X-ray diffraction, critical caracteristics, Jc/B curves, pinning force, critical current density, angular dependence
Ключевые слова: buffer layers, fabrication, manganites, films epitaxial, substrate SrTiO3, PLD process, Raman spectroscopy, HTS, GdBCO, tapes
Ключевые слова: experimental results, chalcogenide, FeSeTe, coated conductors, PLD process, substrate Hastelloy, IBAD process, buffer layers, magnetron sputtering, targets, X-ray diffraction, thickness dependence, lattice parameter, resistive transition, critical temperature, microstructure, critical current density, pnictides, comparison, critical caracteristics, upper critical fields, Jc/B curves, temperature dependence, pinning force
Ключевые слова: HTS, YGdBCO, doping effect, pinning centers artificial, coated conductors, PLD process, IBAD process, substrate Hastelloy, X-ray diffraction, lattice parameter, microstructure, magnetization, temperature dependence, critical temperature, critical caracteristics, Jc/B curves, pinning force, pinning mechanism, critical current density, angular dependence, experimental results, in-field performance
Ключевые слова: HTS, YBCO, thin films, fabrication, PLD process, mechanical properties, strain effects, size effect, thickness dependence, substrate LaAlO3, substrate SrTiO3, X-ray diffraction, microstructure, Raman spectroscopy, lattice parameter, resistive transition, critical temperature, experimental results
Ключевые слова: HTS, coated conductors, tapes, YBCO, thin films, pinning centers artificial, doping effect, nanorods, nanoscaled effects, growth rate, fabrication, targets, PLD process, substrate SrTiO3, X-ray diffraction, microstructure, magnetization, pinning force, critical caracteristics, critical current density, angular dependence, experimental results, modeling, numerical analysis, comparison
Wang H., Zhang Y., Haugan T., Zhang D., Huang J., Wu J., Sebastian M.A., Jian J., Gautam B., Ogunjimi V.
Ключевые слова: MgB2, thin films, fabrication, PLD process, in-situ process, annealing process, magnetization, resistivity, temperature dependence, X-ray diffraction, Jc/B curves
Strbik V., Chromik S., Spankova M., Rosova A., Camerlingo C., Sojkova M., Talacko M., Bareli G., Jung G.
Ключевые слова: HTS, YBCO, thin films, films epitaxial, substrate single crystal, comparison, PLD process, irradiation effects, electron irradiation, defects, Raman spectroscopy, resistive transition, critical caracteristics, critical current, temperature dependence, oxygen, composition, electron diffraction, microstructure
Ключевые слова: HTS, YBCO, Y_YbBCO, YSmBCO, films, PLD process, substrate SrTiO3, fabrication, growth rate, pinning, targets, phase diagram, X-ray diffraction, microstructure, critical caracteristics, Jc/B curves
Ключевые слова: HTS, YBCO, MOCVD process, PLD process, comparison, coated conductors, CORC cables, winding configurations, design parameters, thickness dependence, width, former, geometry effects, critical caracteristics, critical current, n-value, current-voltage characteristics, mechanical properties, strain effects, experimental results
Ключевые слова: HTS, GdBCO, coated conductors multifilamentary, stacked blocks, levitation performance, temperature dependence, substrates, thickness dependence, critical current, PLD process, RCE-CDR process, comparison, measurement technique, experimental results, numerical analysis, trapped field distribution, induction, distribution
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